Amanatulhay Pribadi, A.D. Garnadi, S. Nurdiati
Phantoms are essentially required to generate boundary data for studying the inverse solver performance in electrical impedance tomography (EIT). A resistive-based boundary data simulator (BDS) is developed to generate accurate boundary data using neighbouring current pattern for assessing the EIT inverse solvers. Domain diameter, inhomogeneity number, inhomogeneity geometry (shape, size, and position), background conductivity, and inhomogeneity conductivity are all set as BDS input variables. Different sets of boundary data are generated by changing the input variables of the BDS, and resistivity images are reconstructed using electrical impedance tomography and diffuse optical tomography reconstruction software (EIDORS).
EIT, BDS, EIDORS
Daniels, A. R., R. G. Green, and I. Basarab-Horwath. (1996): “Modelling of three-dimensional resistive discontinuities using HSPICE.” Measurement Science and Technology 7.3 338.
Gagnon, H., Cousineau, M., Adler, A., & Hartinger, A. E. (2010). A resistive mesh phantom for assessing the performance of EIT systems. Biomedical Engineering, IEEE Transactions on, 57(9), 2257-2266.
Hahn, G., A. Just, J. Dittmar, and G. Hellige. (2008) “Systematic errors of EIT systems determined by easily-scalable resistive phantoms.” Physiological measurement 29, no. 6: S163.
M.A. Hussain, B. Noble, B. Becker, (1989) Computer Simulation of an Inverse Problem for Electric Current Computed Tomography using a Uniform Triangular Discretization, Engineering in Medicine and Biology Society, 1989. Images of the Twenty-First Century., Proceedings of the Annual International Conference of the IEEE Engineering in. IEEE, 1989.
Péter Krammer, Andreas D. Waldmann, Michel Zogg, Péter L. Róka1, Josef X. Brunner and Stephan H. Bohm, (2015), Electrical impedance tomography simulator, Proceedings EIT2015, p40.
Jun Gu, W Yin, Yannian Rui, Chao Wang, and Huaxiang Wang, “A New Resistor Network Based Forward Model for Electrical Impedance Tomography Sensors,” International Instrumentation and Measurement Technology Conference, Singapore, 5-7 May 2009